| Scanning Microscopy |
ISSN: 0891-7035 |
Scanning Microscopy International, P.O. Box 66507
AMF O'Hare (Chicago), IL 60666, USA
Telephone: (847) 524-6677 / FAX: (847) 985-6698 / E.mail:73211.647@compuserve.com
Page 1
Multivariate Image Analysis and Segmentation in Microanalysis
N. Bonnet, M. Herbin, P. Vautrot
Page 23
Quantitative Energy-Filtered Convergent Beam Electron Diffraction - Matching Theory to Experiment
M. Saunders, P.A. Midgley , T.D. Walsh , E.S.K. Menon, A.G. Fox, R. Vincent
Page 31
Quantification of Energy Filtered Lattice Images and Coherent Convergent Beam Patterns
C.B. Boothroyd
Page 43
The Interpretation of Ptychographical Reconstructions from Sphalerite Structures
T. Plamann
Page 53
Geometric Phase Analysis of High Resolution Electron Microscope Images
M.J. H˙tch
Page 67
Phase-Retrieval X-Ray Microscopy by Wigner-Distribution Deconvolution: Signal Processing
H.N. Chapman
Page 81
Probe and Object Function Reconstruction in Incoherent Scanning Transmission Electron Microscope Imaging
P.D. Nellist, S.J. Pennycook
Page 91
The “Optical Potential” and Multiple Diffuse Scattering in Dynamical Electron Diffraction and Imaging
Z.L. Wang, W.D. Mo
Page 109
An Evaluation of Noisy Images of Helical Structures and the Detection of High Resolution Data
D.G. Morgan, D.J. DeRosier
Page 131
Effects of Angular Oversampling in Three-Dimensional Reconstruction
N. Boisset, P.A. Penczek, J.-C. Taveau, V. You, F. de Haas, J. Lamy
Page 147
Three Dimensional Reconstruction with Contrast Transfer Compensation from Defocus Series
P.A. Penczek, J. Zhu, R. Schröder, J. Frank
Page 155
The Moving Window Shannon Reconstruction (MWSR) in Real and Fourier Domain and its Use in Tomography
S. Lanzavecchia, P.L. Bellon
Page 171
Radon Transform Techniques for Alignment and Three-Dimensional Reconstruction
M. Radermacher
Page 179
Angular Reconstitution in Three-Dimensional Electron Microscopy: Practical and Technical Aspects
M. Schatz, E.V. Orlova, P. Dube, H. Stark, F. Zemlin, M. van Heel
Page 195
Angular Reconstitution in Three-Dimensional Electron Microscopy: Historical and Theoretical Aspects
M. van Heel, E.V. Orlova, G. Harauz, H. Stark, P. Dube, F. Zemlin, M. Schatz
Page 211
An Automatic Image Acquisition and Analysis System for a Scanning Electron Microscope
N.K. Tovey, J. Wang
Page 229
Automation for On-Line Remote-Control in situ Electron Microscopy
M.A. O’Keefe, B. Parvin, D. Owen, J. Taylor, K.H. Westmacott, W. Johnston, U. Dahmen
Page 241
Element Specific Image Acquisition by Sampling Fourier Components
B.M. Mertens, P. Kruit
Page 251
A New Method for Coma-Free Alignment of Transmission Electron Microscopes and Digital Determination of Aberration Coefficients
G. Ade, R. Lauer
Page 257
Transform Noise Statistics and Fourier Component Estimation
W.O. Saxton
Page 277
Simulation of Transmission and Scanning Transmission Electron Microscopic Images Considering Elastic and Thermal Diffuse Scattering
C. Dinges, H. Rose
Page 287
Computer Simulation Methods for the Analysis of High-Angle Annular Dark-Field (HAADF) Images of Al x Ga 1-x As at High Resolution
G.R. Anstis, S.C. Anderson, C.R. Birkeland, D.J.H. Cockayne
Page 301
Challenges of Three-Dimensional Reconstruction of Ribonucleoprotein Complexes from Electron Spectroscopic Images: Reconstructing Ribosomal RNA
D.R. Beniac, G.J. Czarnota, T.A. Bartlett, B.L. Rutherford, F.P. Ottensmeyer, G. Harauz
Page 323
Solving the Phase Problem in Protein-Electron-Crystallography: Multiple Isomorphous Replacement and Anomalous Dispersion as Alternatives to Imaging
C. Burmester, R.R. Schröder
Page 335
Electron Holography and Lorentz Microscopy of Magnetic Thin Films and Multilayers
M.R. McCartney, D.J. Smith
Page 345
Selected Topics in Charged Particle Interferometry
F. Hasselbach
Page 367
Simulations of Electron Holograms of Long Range Electrostatic Field
G. Matteucci, G. Missiroli, G. Pozzi
Page 375
A Digital Method for Noise Reduction in Holographic Reconstructions and Electron Microscopical Images
G. Ade
Page 379
Maximum Entropy Restoration of Electron Microscope Images with a Random-Spatial-Distribution Constraint
T. Hanai, T. Morinaga, H. Suzuki, M. Hibino
Page 391
Principles and Applications of Defocus-Image Modulation Processing Electron Microscopy
Y. Takai, T. Ando, T. Ikuta, R. Shimizu
Page 407
Electron Holography: Recent Developments
E. Voelkl, L.F. Allard, B. Frost
Page 417
Differential Microscopy in Off-Axis Transmission Electron Microscope Holography
T. Tanji, T. Hirayama
Page 427
Analysis and Simulation of Digital Electron Holograms from Polymer Latexes
Y.C. Wang, T.M. Chou, M. Libera
Page 437
The Use of Stochastic Algorithms for Phase Retrieval in High Resolution Transmission Electron Microscopy
A. Thust, M. Lentzen, K. Urban
Page 455
Direct Retrieval of Object Information from Diffracted Electron Waves
K. Scheerschmidt
Page 467
From High Resolution Image to Atomic Structure: How Far Are We?
D. Van Dyck, E. Bettens, J. Sijbers, M. Op de Beeck, A. van den Bos, A.J. den Dekker
Page 479
Image Algebra and Rank-Order Filters
P.W. Hawkes